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CAS No: 27676-62-6 Catalog No: AG00383U MDL No:MFCD00134700
Title | Journal |
---|---|
Cluster secondary ion mass spectrometry and the temperature dependence of molecular depth profiles. | Analytical chemistry 20120501 |
Molecular depth profiling by wedged crater beveling. | Analytical chemistry 20110815 |
Organic depth profiling of a nanostructured delta layer reference material using large argon cluster ions. | Analytical chemistry 20100101 |
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